Photonics

The WaveLink-OE addresses the unique set of challenges that cannot be addressed by a standard chuck and platen probe station arrangement. A standard 1” x 1” optical breadboard pattern is available on the system base and/or platen. This gives you the flexibility to incorporate whatever sub-systems you need for your specific tasks. The 2” of vertical platen travel (with lock), which can be offset even further as needed, supports a wide range of mounting and positioning mechanics. Several bolt-down chuck options can also be incorporated, depending on your automation needs. If you can conceive of it, the WaveLink-OE can give you a platform to implement it.

	WaveLink-OE Click image for larger view

Backside Probing System Backside and Frontside probing Up to 5 probes or an optional probe card may make contact with a downward facing sample while photon (light) emissions are detected through the back on the complete test area Works with FPD’s and devices from 13mm to 200mm Independent motion control for the device stage, probes and microscope stage, manual or motorized controls available Manual probe station resolution: 1 micron CM300B & 400B motorized X-Y-Z resolution: 0.005 micron Integration with most Emission Detection Microscopes including but not limited to: Semicaps, QFI, Alpha Innotech Backside and Top side visibility for set-up and alignment

	Backside Probing System Click image for larger view